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Fundamentals of Devices and Materials Spring 2008

Average: 3 (1 vote)
Test Date: 
2008
Test Quarter: 
Spring
Type of Test(s): 
Mid-Term

Location

La Jolla, CA 92037
United States
32° 53' 9.2184" N, 117° 14' 6.3708" W

You should study:

  • Diffusion coefficient and mobility in a semiconductor
  • Avalanche breakdown of a pn junction
AttachmentSize
2008_05_29_13_11_15.pdf57 KB


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